Picometer metrology for the GAIA Mission

Details Picometer metrology for the GAIA Mission Picometer metrology for the GAIA Mission

Aug 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009spie.7439e..30m&link_type=abstract

Astronomical and Space Optical Systems. Edited by Warren, Penny G.; Marshall, Cheryl J.; Tyson, Robert K.; Lloyd-Hart, Michael;

Astronomy and Astrophysics

Astronomy

Scientific paper

To measure the relative motions of GAIA's telescopes, the angle between the telescopes is monitored by an all Silicon Carbide Basic Angle Monitoring subsystem (BAM OMA). TNO is developing this metrology system. The stability requirements for this metrology system go into the pico meter and pico radian range. Such accuracies require extreme measures and extreme stability. Specific topics addressed are mountings of opto-mechanical components, gravity deformation, materials and tests that were necessary to prove that the requirements are feasible. Especially mounting glass components on Silicon Carbide and mastering the Silicon Carbide material proved to be a challenge.

Affiliated with

Also associated with

No associations

Rating

Picometer metrology for the GAIA Mission does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Picometer metrology for the GAIA Mission, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Picometer metrology for the GAIA Mission will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1303699