Performance of a silicon vidicon at low signal levels

Details Performance of a silicon vidicon at low signal levels Performance of a silicon vidicon at low signal levels

Dec 1976

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1976apopt..15.3105h&link_type=abstract

Applied Optics, vol. 15, Dec. 1976, p. 3105-3110.

Computer Science

Performance

1

Noise Reduction, Optical Communication, Performance Tests, Signal Detectors, Vidicons, Background Noise, Silicon, System Effectiveness, Volt-Ampere Characteristics

Scientific paper

An integrating camera based on a cooled silicon vidicon detector is briefly described. A treatment is given of the capacitive lag which limits the performance for small signals. The remedy is to alter the cathode voltage after erase to place a pedestal of about 100,000 electrons/pixel under the signal. Test results indicate that the background noise level cannot be reduced below 600 electrons/pixel in a processed frame, and values may approach 1000. Despite these limitations, the vidicon is found to be a useful and sensitive detector.

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