Optical-mechanical method for measurements in microtechnologies

Details Optical-mechanical method for measurements in microtechnologies Optical-mechanical method for measurements in microtechnologies

Oct 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004spie.5553..338t&link_type=abstract

Advanced Wavefront Control: Methods, Devices, and Applications II. Edited by Gonglewski, John D.; Gruneisen, Mark T.; Giles, Mi

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A convenient method for exact recognitions of the curved shape and amplitudes of vibrated micro cantilevers is presented. The method includes the analysis based on preliminary introduction of the formulas for the shapes of deviated cantilevers to get the intensity distribution R(ξ) of the optical pattern of image. The feature of this method is the possibility to get high accuracy for MEMS orientation.

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