Statistics – Applications
Scientific paper
Dec 1985
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985opin.book.....h&link_type=abstract
New York: Academic Press, 1985
Statistics
Applications
23
Interferometry, Optical Measuring Instruments, Astronomical Photometry, Coherent Radiation, Diffraction Patterns, Fourier Transformation, Holographic Interferometry, Laser Interferometry, Polarized Light, Speckle Patterns, Thin Films, Wave Diffraction, Wave Fronts
Scientific paper
Recent developments in optical interferometry and their future applications are discussed. The concepts of two-beam and multi-beam interferences and coherence are examined. Interference in thin films, antireflection coatings, and interference filters is analyzed. The use of a laser as a light source and techniques for obtaining a single-frequency output and for frequency stabilization are described. The applications of optical interferometry to length measurements, optical surface testing, interference spectroscopy, and Fourier-transform spectroscopy are studied. The principles of holography, holographic interferometry, speckle interferometry, and stellar interferometry are considered.
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