Operation, performance, and reliability testing of charge-coupled devices for star trackers

Details Operation, performance, and reliability testing of charge-coupled devices for star trackers Operation, performance, and reliability testing of charge-coupled devices for star trackers

Aug 1987

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1987opten..26..725h&link_type=abstract

Optical Engineering (ISSN 0091-3286), vol. 26, Aug. 1987, p. 725-733.

Astronomy and Astrophysics

Astronomy

2

Charge Coupled Devices, Ground Tests, Star Trackers, Thermal Stresses, White Noise, X Ray Astronomy, Amplifier Design, Charge Injection Devices, Error Analysis, Low Noise, Peltier Effects, Rosat Mission

Scientific paper

State-of-the-art CCDs enable two-axis star trackers to measure star positions to accuracies of 1/50th of a pixel over the entire chip area. Attention is presently given to the performance, testing, and qualification of the P8604 CCDs that will be used by the Rosat X-ray astronomy satellite. The best-quality devices are found to be free of all image blemishes, and have a white noise of 15 nV/sq rt Hz, deferred charge of less than 1 percent, and response uniformity of 1.5 percent rms. Seven-year continuous mission operation simulations of voltage and temperature stress have been passed by these CCDs.

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