On the use of the photometric method to study the topography of Mars

Details On the use of the photometric method to study the topography of Mars On the use of the photometric method to study the topography of Mars

Apr 1978

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1978sva....22..239b&link_type=abstract

(Astronomicheskii Zhurnal, vol. 55, Mar.-Apr. 1978, p. 419-425.) Soviet Astronomy, vol. 22, Mar.-Apr. 1978, p. 239-242. Transla

Astronomy and Astrophysics

Astronomy

Astronomical Photometry, Mars Photographs, Mars Surface, Topography, Albedo, Error Analysis, Legendre Functions, Mars Atmosphere, Mars Craters, Microwaves, Optical Reflection, Optical Thickness, Wavelengths

Scientific paper

The conditions providing a most effective use of the photometric method for determining inclinations on the Martian surface are examined. It is shown that the method works best near the wavelength 0.4 micron. Estimations of the inclinations of exterior and interior walls made for three craters on the surface of Mars gave the following values: 3 to 4 deg for external and 7 to 8 deg for internal walls.

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