Other
Scientific paper
Sep 1995
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995metic..30q.482a&link_type=abstract
Meteoritics, vol. 30, no. 5, page 482
Other
2
Elements, Trace, Interplanetary Dust Particles, Proton Induced X-Ray Emission (Pixe), Reliability, Synchrotron X-Ray Fluorescence (Sxrf)
Scientific paper
Introduction: The trace element contents of stratospheric interplanetary dust particles (IDPs) eventually provide clues as to their origin(s). Since the masses of IDPs are on the order of nanograms, their trace element contents typically amount to only ab out 10^8 atoms. Therefore all analytical techniques are operating near their limits of detection (LODs) and the question is: how reliable are the trace element data of IDPs? At present three different analytical techniques are applied to measure trace elements in IDPs: Proton Induced X-ray Emission (PIXE), Synchrotron X-ray Fluorescence Analysis (SXRF), and Time Of Flight- or double-focusing Secondary Ion Mass Spectrometry (T OF-SIMS/SIMS). In 1989 we performed a crosscheck between minor and trace element data obtained by SXRF in Hamburg and by PIXE in Heidelberg and found non-conflicting results [1]. Here we report on a new chrosscheck between results acquired with the new He idelberg PIXE facility [2] and the actual SXRF facility in Brookhaven [3]. Measurements: Three IDPs, L2005AB2 (~12 micrometers), L2011K1 (~15 x 25 micrometers), and L2011R13 (~17 x 34 micrometers), were first analyzed with SXRF in 1994 and re-analyzed with PIXE in March 1995. The PIXE data were aquired in two runs with different absorbers in front of the detector. One spectrum was obtained with a 45 micrometers Be-absorber and a 5 pA beam of 2x2 micrometers^2 during 20-50 min for each particle. For a second analysis we used a 155 micrometers Al-absorber and a 5x5 micrometers^2 beam of ~300 pA for 60-120 min. The SXRF data were aquired in one ru n (<30 min) with a thick Al-absorber and a beam size of roughly 20x20 micrometers^2. Results: The resulting element weight-ratios normalized to iron (set to be =19.04%=CI [4]) are presented in Tab.1. Abundances normalized to Fe and to the respective CI(=solar) ratios from Anders and Grevesse are shown in Fig.1. With only a few exceptions, there is a very good agreement between the PIXE and the SXRF results. Since the SXRF data were aquired only with a thick absorber the SXRF-LODs are rather high (~CI) for Ti. The largest discrepancy was found in particle L2011R13 for Se (PIXE/SXRF=1.6). All other elements agree within a maximum factor of 1.4. Conclusion: PIXE and SXRF analyses of three IDPs (12-30 micrometers) lead to consistent abundances for the elements from Ti to Br. Thus, major, minor, and trace element data obtained by these two facilities on small particles can be directly compared. References: [1] Wallenwein R. et al. (1989) LPS XX, 1171-1172. [2] Traxel K. et al. (1995) NIM, in press. [3] Sutton S. R. and Flynn G. J. (1988) Proc. LPSC 18th, 607-614. [4] Anders E. and Grevesse N. (1989) GCA, 53, 197-214.
Arndt Peter
Flynn George James
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