Nuclear fragmentation studies for microelectronic application

Details Nuclear fragmentation studies for microelectronic application Nuclear fragmentation studies for microelectronic application

Jul 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989stin...8930154n&link_type=abstract

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Computer Science

Energy Dissipation, Energy Transfer, Formalism, Microelectronics, Collision Parameters, Data Bases, Energy Spectra

Scientific paper

A formalism for target fragment transport is presented with application to energy loss spectra in thin silicon devices. Predicted results are compared to experiments with the surface barrier detectors of McNulty et al. The intranuclear cascade nuclear reaction model does not predict the McNulty experimental data for the highest energy events. A semiempirical nuclear cross section gives an adequate explanation of McNulty's experiments. Application of the formalism to specific electronic devices is discussed.

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