NPL correction kit for enhanced and traceable reflectance measurement

Details NPL correction kit for enhanced and traceable reflectance measurement NPL correction kit for enhanced and traceable reflectance measurement

Jul 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4826..123c&link_type=abstract

Fourth Oxford Conference on Spectroscopy. Edited by Springsteen, Art; Pointer, Michael. Proceedings of the SPIE, Volume 4826,

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Scientific paper

A prototype kit containing artefacts, best practice guide and software for enhancing reflectance measurement data are described. The kit uses measurements made on calibrated artefacts to make other reflectance measurement data more reliable, in terms of zero offset and linearity, while also providing traceability to national reflectance scales. The use of the kit can give agreement between measurements made on the same artefact by different instruments of less than the colour discrimination limit of the human eye of 0.5 ΔE*ab colour difference units.

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