Notch and large-area CCD imagers

Details Notch and large-area CCD imagers Notch and large-area CCD imagers

Jul 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1447..310b&link_type=abstract

Proc. SPIE Vol. 1447, p. 310-315, Charge-Coupled Devices and Solid State Optical Sensors II, Morley M. Blouke; Ed.

Computer Science

Performance

3

Scientific paper

A technique for improving the performance of large-area high-resolution charge-coupled device (CCD) imagers is described. Adding an additional doped channel down the center of a CCD register provides for charge confinement. This leads to improved charge transfer efficiency and resistance to radiation damage. Two-dimensional theoretical analysis is shown along with measured device performance.

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