Nondestructive characterization of Hg1-xCdxTe layer structures by magneto-thermoelectric measurements

Details Nondestructive characterization of Hg1-xCdxTe layer structures by magneto-thermoelectric measurements Nondestructive characterization of Hg1-xCdxTe layer structures by magneto-thermoelectric measurements

Dec 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.2021..222b&link_type=abstract

Proc. SPIE Vol. 2021, p. 222-231, Growth and Characterization of Materials for Infrared Detectors, Randolph E. Longshore; Jan W.

Computer Science

1

Scientific paper

The thermoelectric properties of n-type Hg(subscript 0.79)Cd(subscript 0.21)Te (MCT) and of MCT layers with n-p-n structure were investigated in transverse magnetic fields (B (perpendicular) $Delta; 0

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