Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

Details Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors

Sep 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2280..101f&link_type=abstract

Proc. SPIE Vol. 2280, p. 101-108, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, Oswald H. Siegmund; John V. Vallerg

Astronomy and Astrophysics

Astronomy

Scientific paper

We describe our recent synchrotron measurements of microchannel plate
(MCP) quantum detection efficiency made in pulse-counting mode in a
40-300 eV band containing the L shell absorption edges of silicon. The
significance of this data for the calibration of the HRC-S transmission
grating detector for the AXAF-I X-ray observatory is discussed.

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