Nanometric precision bidimensional optical flat testing

Details Nanometric precision bidimensional optical flat testing Nanometric precision bidimensional optical flat testing

Aug 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2775..128m&link_type=abstract

Proc. SPIE Vol. 2775, p. 128-134, Specification, Production, and Testing of Optical Components and Systems, Anthony E. Gee; Jean

Computer Science

Scientific paper

Absolute optical flat testing using the classical three flat method poses repositioning problems and basically only yields one absolute diameter. Although not giving access tot he mean curvature, the method we propose only requires relative displacements and yields a 2D map of the departure of the flat to the best sphere. Simulations and experimental data have been achieved up to a 301 by 301 sampling, showing a repeatability in the neighborhood of 1 nm P-V.

Affiliated with

Also associated with

No associations

Rating

Nanometric precision bidimensional optical flat testing does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Nanometric precision bidimensional optical flat testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Nanometric precision bidimensional optical flat testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-774902