Statistics – Applications
Scientific paper
Aug 2005
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005aipc..780..151p&link_type=abstract
NOISE AND FLUCTUATIONS: 18th International Conference on Noise and Fluctuations - ICNF 2005. AIP Conference Proceedings, Volume
Statistics
Applications
Noise Processes And Phenomena, Ii-Vi Semiconductors, Applications Of Monte Carlo Methods
Scientific paper
Noise in optoelectronic devices is a critical parameter since it can affect dramatically the quality of target discrimination. In the domain of LWIR atmospherical window photodetection, used in the framework of night-vision applications, mercury-cadmium-telluride is a widely used material. We propose the first kinetic calculation of Hg0.8Cd0.2Te noise parameters, that is of diffusion coefficient, spectral density and noise temperature, and investigate the importance of the excess noise due to the presence of impact-ionization processes.
Azaïs Bruno
Gruzinskis V.
Millithaler Jean-Francois
Palermo C.
Shiktorov P.
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