Modeling the image distortion of echelle spectrographs with T&P changes

Details Modeling the image distortion of echelle spectrographs with T&P changes Modeling the image distortion of echelle spectrographs with T&P changes

Aug 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009spie.7440e..43g&link_type=abstract

Techniques and Instrumentation for Detection of Exoplanets IV. Edited by Shaklan, Stuart B. Proceedings of the SPIE, Volume 744

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Even slight changes of temperature and pressure in high resolution Échelle spectrographs affect the spot image on the detector plane. At the same time astronomical applications require a stability of the measurement of up to 1/3000 of a pixel on the CCD (with a typical pixel size being 15μm). With this paper we present a study of the effects of thermal and pressure instabilities on ray tracing models of a typical Échelle spectrograph. We conclude the required minimum stabilty in these two parameters to reach the goal of precision spectroscopy.

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