Computer Science – Performance
Scientific paper
Nov 1990
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1329..337b&link_type=abstract
IN: Optical system contamination: Effects, measurement, control II; Proceedings of the Meeting, San Diego, CA, July 10-12, 1990
Computer Science
Performance
Cameras, Charge Coupled Devices, Contaminants, Cryogenic Temperature, Ultraviolet Photography, Hubble Space Telescope, Performance Tests, Wide Angle Lenses
Scientific paper
A model is developed to predict the deposition of contaminants on the CCD sensors of the Wide Field Planetary Camera to determine expected performance parameters. Contaminant deposition due to internal instrument sources is considered as is the mechanism of transport to the CCDs themselves. The Contamination Analysis Program (CAP) model considers deposition and reemission kinetics, nodal containment sources, and internodal shape factors related to line-of-sight transport. Indirect transport is also accounted for in the CAP model by considering the effect of diffuse reflection at internodal exchanges. The effective total transport factors for each node-to-node exchange is precalculated to reduce the effective number of nodes and reducing run time of the CAP program. The method is applied to four distinct conditions and is found to be suitable for the analysis of internal self-contamination. Cold traps, venting, and vacuumlike design are factors which are found to be important for cold-sensitive sensors.
Barengoltz Jack B.
Jenkins Teresa
Millard Jerry M.
Taylor Daniel M.
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