Statistics – Applications
Scientific paper
Oct 2001
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001spie.4369..458s&link_type=abstract
Proc. SPIE Vol. 4369, p. 458-466, Infrared Technology and Applications XXVII, Bjorn F. Andresen; Gabor F. Fulop; Marija Strojnik
Statistics
Applications
Scientific paper
Mercury Cadmium Telluride focal plane arrays with well over 1000 pixels have been fabricated for a number of years. These FPA's have been built as large two-dimensional arrays of HgCdTe p-n junction diodes on a single CdTe or CdZnTe substrate. Sensitivity of each pixel to impinging radiation is one of the most important quality factors for these devices. However, material parameters, which give diode high sensitivity, are the same as those that cause cross talk between adjacent diodes in the array. This cross talk causes a blurred image and in general is a detrimental factor for the FPA system. The cross talk modeling is done in a two- dimensional simulation format to achieve high accuracy. In addition, the output information can be generated as a statistical function of the material and design parameter variations. Actual heterojunction FPA devices have been fabricated and tested for cross talk. In the paper, this data is compared to the simulation results. This design method and its algorithms are encapsulated in a software program called IRSIM. This physics-based simulator allows the engineer to use versatile geometries and material concentrations.
Caraway E. L.
Fischer Theodore
Hess Glenn T.
Newsome Gwendolyn W.
Sanders Thomas J.
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