Miniaturized atomic force microscope for planetary exploration

Details Miniaturized atomic force microscope for planetary exploration Miniaturized atomic force microscope for planetary exploration

Sep 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001esasp.480...11g&link_type=abstract

In: Proceedings of the 9th European Space Mechanisms and Tribology Symposium, 19-21 September 2001, Liège, Belgium. Compiled by

Computer Science

Atomic Force Microscope, Miniaturisation

Scientific paper

The Atomic Force Microscope (AFM) has revealed itself as a reliable tool for characterizing surface topography with nanometer resolution. In principle, a sharp tip mounted on a cantilever is brought into close proximity of the sample surface. The forces acting between the sample and the tip slightly deflect the cantilever. Scanning across the surface while recording this deflection provides a topographic image of the sample. As in most space experiments, performing microscopy measurements on a planetary mission requires a good trade-off between the experiment's weight and size and the quality and relevance of the measured data. A plain optical setup with acceptable size and weight for a space launch will provide images with limited resolution. Thus, atomic force microscopy with a well designed instrument can be complementary to an optical setup for increasing image resolution and getting higher scientific throughput. At the first glance, high sensitivity and required interaction between the instrument and the operator render the AFM unsuitable for planetary missions. However, micro-fabrication technology combined with innovative design ideas allowed us to build an error tolerant system with functionality for addressing the above mentioned challenges.

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