Mathematics – Probability
Scientific paper
Oct 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994adspr..14..797m&link_type=abstract
Advances in Space Research (ISSN 0273-1177), vol. 14, no. 10, p. 797-807
Mathematics
Probability
7
Crres (Satellite), Galactic Cosmic Rays, Microelectronics, Single Event Upsets, Solar Protons, Inner Radiation Belt, Linear Energy Transfer (Let), Proton Belts, Radiation Measuring Instruments, Relativistic Particles
Scientific paper
A MicroElectronics Test Package (MEP) measured total dose degradation and Single Event Upsets (SEUs) on 60 device types on the Combined Release and Radiation Effects Satellite (CRRES) in a 19 deg inclination orbit between 350 km and 36000 km from July 1990 to October 1991. Simultaneous measurements of the high energy particle environment were used to make a direct cause and effect comparison of the energetic particle background and microelectronic performance characteristics. The galactic cosmic ray background for the period of the CRRES mission was at a minimum. The SEUs experiences from the cosmic ray background were correspondingly few in number, but surprisingly produced an equal probability of upset over an L-shell range of 8.5 Earth radii R(sub E) down to less than 3.0 R(sub E). Cosmic ray induced upset frequencies in proton sensitive chips were over 2 orders of magnitude lower than those produced by protons in the heart of the inner proton radiation belts. Multiple upsets, those produced when a single particle upsets more than one memory location, were just as common from protons as from cosmic rays.
Mullen E. G.
Ray Pallav Kumar
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