Metrology source for high-resolution heterodyne interferometer laser gauges

Details Metrology source for high-resolution heterodyne interferometer laser gauges Metrology source for high-resolution heterodyne interferometer laser gauges

Jul 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3350..973d&link_type=abstract

Proc. SPIE Vol. 3350, p. 973-984, Astronomical Interferometry, Robert D. Reasenberg; Ed.

Computer Science

Performance

Scientific paper

We describe the development, functional performance, and space-qualification status of a Metrology Source suitable for implementation of space-based metrology systems with picometer-level relative displacement measurement and micron-level absolute displacement measurement resolution. The Metrology Source consists of the following components: lasers, frequency stabilization system, frequency shifters, and frequency modulators. All components are interconnected by polarization maintaining fibers to facilitate integration into a lightweight space-qualifiable module.

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