Metrology for the Micro-Arcsecond Metrology testbed

Details Metrology for the Micro-Arcsecond Metrology testbed Metrology for the Micro-Arcsecond Metrology testbed

Jul 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3350..100k&link_type=abstract

Proc. SPIE Vol. 3350, p. 100-108, Astronomical Interferometry, Robert D. Reasenberg; Ed.

Astronomy and Astrophysics

Astronomy

2

Scientific paper

The Space Interferometry Mission (SIM) relies on the combination of interferometry with a metrology system capable of measuring picometer relative length changes and micrometer absolute lengths. We are designing the micro- arcsec metrology test-bed (MAM) to put these two systems together in a large vacuum tank. The interferometer has a 1.8 m baseline and is looking at an artificial star 10 m away. The metrology system is measuring the distances between the interferometer mirrors, the interferometer mirrors and the 'star', and the interferometer arm lengths. We are using two common path laser heterodyne interferometers to monitor each of these distances. The light sources used are two Nd:YAG lasers with different frequencies, f(subscript 0) and F(subscript 0) + 30 GHz. This allows measurement of relative lengths changes as well as absolute lengths. The design for the heterodyne interferometers is in progress using our experience from 1D and 3D metrology experiments performed in the past. Modifications include reducing the cross-talk in the internal metrology and adding a polarizing beamsplitter to the laser light path to compensate for path lengths changes caused by temperature changes.

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