Statistics – Methodology
Scientific paper
Jul 1998
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3379..510h&link_type=abstract
Proc. SPIE Vol. 3379, p. 510-519, Infrared Detectors and Focal Plane Arrays V, Eustace L. Dereniak; Robert E. Sampson; Eds.
Statistics
Methodology
Scientific paper
A methodology for validating the measured relative spectral response function of infrared detectors is described. Typically, the spectral response of sister detectors, fabricated on the same wafer as the detectors for infrared focal plane arrays (IRFPA's), are characterized in lieu of measuring the spectral response of the actual IRFPA. It is then generally assumed that the spectral characteristics of the IRFPA detectors are equivalent to the spectral characteristics of the sister detectors. To validate this assumption, a measurement methodology has been developed to assess the accuracy the measured relative spectral response curves. This methodology is based on the premise that infrared detector's measured peak responsivity is independent of the spectral content of the irradiance at the detector. The peak wavelength responsivity of the infrared detector is measured as a function of spectral photon irradiance to evaluate the accuracy of the measured detector relative spectral response. If the measured peak responsivity of the infrared detector is independent of spectral irradiance, then the measured spectral response accurately represents the spectral characteristics of the infrared detector. However, if the peak responsivity varies with spectral irradiance, then the measured spectral response is in error. The shape of the peak responsivity versus spectral irradiance curve provides insight into the spectral region where the measured spectral response is in error. Sample relative spectral response data are presented along with analysis of the spectral response curves.
Dereniak Eustace L.
Garcia John
Hubbs John E.
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