Measuring the spatial variation in the depth and composition of the ACIS contaminant with PKS 2155-304.

Details Measuring the spatial variation in the depth and composition of the ACIS contaminant with PKS 2155-304. Measuring the spatial variation in the depth and composition of the ACIS contaminant with PKS 2155-304.

Sep 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003cxo..prop.1626c&link_type=abstract

Chandra Proposal ID #05708178

Computer Science

Chandra Proposal Id #05708178

Scientific paper

The calibration team plans on measuring the spatial variation in the depth and composition of the contaminant on ACIS with four 42 ksec LETG/ACIS-S observations of PKS 2155-304. These observations will be taken at 4 different SIM_Z positions from -9.8 mm to +9.9 mm, corresponding to row numbers of 100 through 924. Each observation will measure the optical depth at the O-K edge with an accuracy of approximately 10%. These observations were initially scheduled to take place immediately before the ACIS bake-out (presently scheduled for Sept. 2004), but since the depth of the contaminant is only slowly increasing with time, it is more important from a calibration point of view to obtain these data now.

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