Measurement results of the crystallographic orientation of the SC cut round plates

Computer Science

Scientific paper

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Crystallography, Goniometers, X Ray Diffraction, Atomic Structure, Crystal Structure, Optical Properties

Scientific paper

Investigations and analysis of the main measurement errors of crystallographic orientation of doubly rotated cuts are reported. On the basis of the results, a procedure to measure the crystal orientation of rectangular and round plates using the standard double reflection goniometer with simple additional equipment was developed. Using this procedure the crystallographic orientation measurements of SC (Stress Compensation) cut plates with reference to selected atomic planes were carried out. A review of factors involving the measurement inaccuracy measurement procedure, as well as measurement and calculation results for the SC round plates is given. The achieved measurement accuracy of crystallographic orientation of these plates was better than 5 seconds (for selected atomic planes). The time consumption of one plate orientation measurement was not longer than 5 minutes.

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