Measurement of the mid-infrared emission spectrum of diamond

Details Measurement of the mid-infrared emission spectrum of diamond Measurement of the mid-infrared emission spectrum of diamond

Jun 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998aipc..430..526p&link_type=abstract

The eleventh international conference on fourier transform spectroscopy. AIP Conference Proceedings, Volume 430, pp. 526-530 (1

Other

Other Solid Inorganic Materials, Other Nonmetallic Inorganics

Scientific paper

A method for measuring the emission spectra of diamond wafers, typically 0.1 to 1 mm thick, is described. The method uses a 40 W continuous CO laser (1800 cm-1 to 1900 cm-1) to heat the diamond to ~500 °C suspended in an evacuable cell in an emission collection accessory to a Fourier transform infrared spectrometer (FTIRS). A shutter protects the FTIRS from the intense laser light during the heating process and opens immediately after the laser is turned off to measure the emission as the specimen cools. The spectra are referenced to a ``black body'' source that uses the same evacuable cell window. Data from synthetic and natural diamonds are reported.

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