Measurement of the atomic oxygen profile in the lower thermosphere by means of semiconductor detectors

Details Measurement of the atomic oxygen profile in the lower thermosphere by means of semiconductor detectors Measurement of the atomic oxygen profile in the lower thermosphere by means of semiconductor detectors

May 1981

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1981kosis..19..415l&link_type=abstract

Kosmicheskie Issledovaniia, vol. 19, May-June 1981, p. 415-420. In Russian.

Computer Science

Sound

1

Atmospheric Composition, Atmospheric Sounding, Oxygen Atoms, Semiconductor Devices, Thermosphere, Adsorption, Detectors, Rocket Sounding, Thin Films, Water Vapor

Scientific paper

The principles underlying the use of thin-film semiconductor detectors to measure the atomic oxygen profile in the lower thermosphere are presented. A sounding-rocket experiment is described in which such detectors were used to measure the atomic oxygen profile of the lower thermosphere above Volgograd on December 17, 1979. Results obtained using the semiconductors detectors are compared to those obtained using other methods; on the whole, the semiconductor results agree well with other data.

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