Measurement of small birefringence in sapphire and quartz plates

Details Measurement of small birefringence in sapphire and quartz plates Measurement of small birefringence in sapphire and quartz plates

Sep 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002spie.4819...20g&link_type=abstract

Polarization Measurement, Analysis, and Applications V. Edited by Goldstein, Dennis H.; Chenault, David B. Proceedings of th

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Birefringence in quartz and sapphire plates was measured at 632.8 nm. The observed birefringence is presumed to be caused by a tilt in the optic axis with respect to the plate geometry. Two instrumental methods were used to make the measurements. A Mueller matrix laser polarimeter was used at the Air Force Research Laboratory, and the Exicor system was used at Hinds. The measurement techniques are described and results are presented.

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