Computer Science – Information Theory
Scientific paper
2009-06-17
Microelectronics Reliability, 2010
Computer Science
Information Theory
Scientific paper
10.1016/j.microrel.2010.07.156
The application of current generation computing machines in safety-centric applications like implantable biomedical chips and automobile safety has immensely increased the need for reviewing the worst-case error behavior of computing devices for fault-tolerant computation. In this work, we propose an exact probabilistic error model that can compute the maximum error over all possible input space in a circuit specific manner and can handle various types of structural dependencies in the circuit. We also provide the worst-case input vector, which has the highest probability to generate an erroneous output, for any given logic circuit. We also present a study of circuit-specific error bounds for fault-tolerant computation in heterogeneous circuits using the maximum error computed for each circuit. We model the error estimation problem as a maximum a posteriori (MAP) estimate, over the joint error probability function of the entire circuit, calculated efficiently through an intelligent search of the entire input space using probabilistic traversal of a binary join tree using Shenoy-Shafer algorithm. We demonstrate this model using MCNC and ISCAS benchmark circuits and validate it using an equivalent HSpice model. Both results yield the same worst-case input vectors and the highest % difference of our error model over HSpice is just 1.23%. We observe that the maximum error probabilities are significantly larger than the average error probabilities, and provides a much tighter error bounds for fault-tolerant computation. We also find that the error estimates depend on the specific circuit structure and the maximum error probabilities are sensitive to the individual gate failure probabilities.
Alam Syed M.
Bhanja Sanjukta
Lingasubramanian Karthikeyan
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