Lineshape determination using multiple pathlengths in Fourier transform interferometers

Details Lineshape determination using multiple pathlengths in Fourier transform interferometers Lineshape determination using multiple pathlengths in Fourier transform interferometers

Sep 1994

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2266..510c&link_type=abstract

Proc. SPIE Vol. 2266, p. 510-521, Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research, Jinxu

Computer Science

Scientific paper

In Fourier transform spectroscopy degradation in spectral resolution and the introduction of false spectral features (`feet') both result from the limited optical pathlength used by a real instrument. This work describes a quantitative relationship between the truncation length of an interferogram and the distortion of the computed halfwidth for the three most common spectral shapes: Gaussian, Lorentzian, and Voigt profiles. The technique can also be used to aid in the alignment and calibration of a Fourier transform interferometer by deriving a calculated truncated interferogram lineshape of a `known' spectral line to compare with the lineshape actually produced by the instrument.

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