Computer Science
Scientific paper
Jul 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4826...21h&link_type=abstract
Fourth Oxford Conference on Spectroscopy. Edited by Springsteen, Art; Pointer, Michael. Proceedings of the SPIE, Volume 4826,
Computer Science
Scientific paper
In the past decade, scales for infrared spectral regular (specular) transmittance and reflectance have been established at the National Institute of Standards and Technology (NIST). Recently, we have developed an error budget based on direct evaluation of the sources of error in the measurement process. These include the detection system non-linearity, spatial non-uniformity of the detector, misalignment of components, inter-reflection between components, asymmetry of sample and reference measurements, and source polarization effects. Here we describe the evaluation of the linearity of our measurement system that includes a Fourier transform spectrophotometer, integrating sphere and MCT detector. From the linearity results, relative responsivity curves are also established.
Hanssen Leonard M.
Kaplan Simon G.
No associations
LandOfFree
Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-1885464