Light yield and Fano factor for X rays in xenon gas proportional scintillation counters

Details Light yield and Fano factor for X rays in xenon gas proportional scintillation counters Light yield and Fano factor for X rays in xenon gas proportional scintillation counters

Oct 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2808..613b&link_type=abstract

Proc. SPIE Vol. 2808, p. 613-616, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, Oswald H. Siegmund; Mark A. Gummi

Astronomy and Astrophysics

Astronomy

Scientific paper

The light yield, or electroluminescence yield, of pure xenon for reduced electric fields below the ionization threshold (about 6 Vcm(superscript -1)torr(superscript -1)) was measured for pressures of 825, 570 and 276 torr using a uniform field gas proportional scintillation counter excited with 5.9 keV x rays. A linear behavior was exhibited from the 1 Vcm(superscript -1)torr(superscript -1) electroluminescence threshold, but the measured yield (for lambda greater than 165 nm) diminished with the gas pressure. The best energy resolution obtained was 7.6% for collimated 5.9 keV x rays with xenon at 825 torr. A Fano factor of 0.26 was measured for the three xenon pressures.

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