Ion beam cleaning of contaminated optics

Details Ion beam cleaning of contaminated optics Ion beam cleaning of contaminated optics

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1329...86f&link_type=abstract

IN: Optical system contamination: Effects, measurement, control II; Proceedings of the Meeting, San Diego, CA, July 10-12, 1990

Computer Science

Cleaning, Cryogenic Equipment, Ion Beams, Mirrors, Spacecraft Contamination, Cryogenic Temperature, Solid Surfaces

Scientific paper

Recent results on ion beam cleaning experiments of super-polished cryogenic mirrors are presented. A variety of contaminants such as air, water, ammonia, and hexane have been studied and some of the experimental parameters necessary to remove these were determined. The mirrors were exposed to a controlled amount of a known contaminant and/or mixtures of known contaminants. Dual-wavelength (0.633- and 10.6-micron) bidirectional reflectance distribution function measurements were made on the clean, contaminated and ion beam cleaned surfaces. These data, along with quartz crystal microbalance measurements and mass spectroscopic data, are used to compare the effect of contaminants and ion beam removal of these contaminants on the scatter properties of various mirror surfaces.

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