Statistics – Methodology
Scientific paper
Oct 1990
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1309.....h&link_type=abstract
Meeting sponsored by SPIE. Bellingham, WA, Society of Photo-Optical Instrumentation Engineers (SPIE Proceedings. Vol. 1309), 199
Statistics
Methodology
1
Conferences, Infrared Imagery, Infrared Instruments, Systems Engineering, Flir Detectors, Focal Plane Devices, Image Processing, Infrared Detectors, Infrared Radiometers, Infrared Telescopes, Pattern Recognition, Signature Analysis, Systems Analysis
Scientific paper
Recent experimental and theoretical investigations in IR system design, analysis, and modeling are examined in reports and reviews. Topics discussed are modeling second-generation thermal imaging systems, performance improvement of an IR imaging system using subsystem MTF analysis, human recognition of IR images, spatial frequency performance of SPRITE detectors, and optimization of Schottky-barrier IR detectors for solar blindness. IR system testing is also considered, focusing on such problems as tolerancing methodology for an IR optical telescope, system response function approach to minimize IR testing errors, and portable MRTD collimator system for fast in situ testing of FLIRs and other thermal imagers.
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