Independent Testing of Silicon PIN Detector Arrays for LSST

Details Independent Testing of Silicon PIN Detector Arrays for LSST Independent Testing of Silicon PIN Detector Arrays for LSST

Dec 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004aas...20510808f&link_type=abstract

American Astronomical Society Meeting 205, #108.08; Bulletin of the American Astronomical Society, Vol. 36, p.1528

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We report full detector characterization of Silicon PIN detector arrays for astronomical applications, with a special emphasis on their use for the Large Synoptic Survey Telescope (LSST). For the first time, we present measurements of dark current, read noise, linearity, persistence, quantum efficiency, well depth, and crosstalk. These properties are measured as functions of temperature (100-240K), wavelength, and read mode.

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