Improved Overlapping Helium Line Profiles

Details Improved Overlapping Helium Line Profiles Improved Overlapping Helium Line Profiles

Mar 1982

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1982apj...254..823m&link_type=abstract

Astrophysical Journal, Vol.254, P. 823, 1982

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Stark profiles of the 4471 Å overlapping He I line are computed at densities of astrophysical interest using the Model Microfield Method (MMM) which provides an improved treatment of the "ion dynamics" effect and is in correct agreement with recent laboratory results. As a main result, MMM profiles show less structure than those calculated with the theory of Barnard, Cooper, and Smith usually used in stellar applications.

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