Computer Science
Scientific paper
Oct 2004
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004spie.5563...46g&link_type=abstract
Image Reconstruction from Incomplete Data III. Edited by Bones, Philip J.; Fiddy, Michael A.; Millane, Rick P. Proceedings of
Computer Science
2
Scientific paper
This paper details significant improvements in current-voltage (I-V) modeling capabilities using an automated iterative non-linear fitting program. The properties of a particular infrared (IR) detector's I-V curve are dependent upon the current limiting mechanisms in the device which depend upon the temperature, applied bias, and cutoff wavelength or detector bandgap. This model includes ideal diode diffusion, generation-recombination, band-to-band tunneling, trap-assisted tunneling, shunt resistance, and avalanche breakdown as potential current limiting mechanisms in an IR detector diode. The modeling presented herein allows one to easily distinguish, and more importantly to quantitatively compare, the amount of influence each current limiting mechanism has on various detector's I-V characteristics. Modeling of the trap-assisted-tunneling mechanism leads to an estimate of the density of occupied trap states at a given temperature. This model is now routinely applied to Raytheon Vision Systems" test structures to better understand detector current limitations.
Bangs James
Gerrish Amanda
Gilmore Angelo S.
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