High-resolution short-wave infrared spectrograph optics

Details High-resolution short-wave infrared spectrograph optics High-resolution short-wave infrared spectrograph optics

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997opten..36.2852p&link_type=abstract

Optical Engineering 36(10), 2852-2856, Brian J. Thompson; Ed.

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An optical system for a high-resolution short-wave IR spectrograph to be employed in remote sensing applications is described. The instrument covers the spectral range from 1200 to 2400 nm and images a 9.4-deg line object onto a 2D PtSi sensor. Spatial and spectral resolution requirements were set at 0.33 mrad and 10 nm, respectively. While signal strength calculations indicated that an aperture equivalent to f/1.8 would be adequate, because of the anticipated lower signal levels at the long-wavelength end, special attention was paid in the antireflection coating design stage to partially compensate for the large discrepancy in signal strengths found across the spectral range.

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