High resolution measurements of atomic and molecular lifetimes using the high frequency deflection technique

Details High resolution measurements of atomic and molecular lifetimes using the high frequency deflection technique High resolution measurements of atomic and molecular lifetimes using the high frequency deflection technique

Feb 1975

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1975phys...11...65e&link_type=abstract

Physica Scripta, vol. 11, Feb. 1975, p. 65-78.

Other

65

Atomic Spectra, Deflection, High Resolution, Molecular Spectra, Decay Rates, Electron Beams, Electron Bombardment, Emission Spectra, Error Analysis

Scientific paper

The basic principles of the high frequency deflection (HFD) technique for the determination of atomic and molecular lifetimes as well as the first experimental tests were presented a couple of years ago. In principle this technique is a further refinement of the conventional multichannel delayed coincidence technique with periodic electron excitation of free molecules. The differences are mainly that the HFD techniques utilizes a continuous electron beam from a high-power gun operating in the kilovolt range and that the periodic excitation is accomplished by sweeping the beam at an optimal rate, i.e., with a period equal to 3-10 times the lifetime to be studied. In this paper we discuss more in detail the technique itself, its properties and possibilities compared to other methods for lifetime measurements. A review of some of the experimental results obtained so far, with particular emphasis on abundance determinations of atoms and molecules of fundamental astrophysical interest, is also included as well as a critical discussion of given error limits in lifetime measurements in general.

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