High resolution 2048 X 16 TDI PtSi IR imaging CCD

Details High resolution 2048 X 16 TDI PtSi IR imaging CCD High resolution 2048 X 16 TDI PtSi IR imaging CCD

Sep 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1308...88d&link_type=abstract

IN: Infrared detectors and focal plane arrays; Proceedings of the Meeting, Orlando, FL, Apr. 18, 19, 1990 (A91-36726 15-35). Bel

Computer Science

1

Charge Coupled Devices, Focal Plane Devices, Image Resolution, Infrared Detectors, Platinum Compounds, High Resolution, Infrared Imagery, Integrated Circuits, Quantum Efficiency, Silicides

Scientific paper

A 2048 x 16 pixel time delay and integrate (TDI) monolithic focal plane array detector using PtSi Schottky barrier photodiodes and an interline CCD architecture was developed. A high resolution was achieved by using 30-micron pixels, with a high sensitivity through the TDI mode of operation. A ripple clocked vertical shift register was used for higher charge capacity, allowing a 43-percent fill factor with a saturated charge capacity of 530,000 electrons.

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