Hard x-ray imaging via crystal diffraction: first results of reflectivity measurements

Details Hard x-ray imaging via crystal diffraction: first results of reflectivity measurements Hard x-ray imaging via crystal diffraction: first results of reflectivity measurements

Oct 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1549..113f&link_type=abstract

Proc. SPIE Vol. 1549, p. 113-119, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, Oswald H. Siegmund; Richard E. Rot

Astronomy and Astrophysics

Astronomy

4

Scientific paper

Hard x-ray reflectivity measurements of mosaic crystals are being performed at the x-ray facility of the physics department of the University of Ferrara. This paper reports on preliminary results obtained by using flat samples of pyrolytic graphite (002) with a thickness of 2 mm and a mosaic spread of 0.3 deg. A short description is given of the experimental apparatus and calibration procedures followed.

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