Global, 4D Differential Emission Measure Analysis of EIT 17.1, 19.5 and 28.4 nm Images

Details Global, 4D Differential Emission Measure Analysis of EIT 17.1, 19.5 and 28.4 nm Images Global, 4D Differential Emission Measure Analysis of EIT 17.1, 19.5 and 28.4 nm Images

Dec 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007agufmsh53a1060f&link_type=abstract

American Geophysical Union, Fall Meeting 2007, abstract #SH53A-1060

Statistics

Computation

7509 Corona, 7554 X-Rays, Gamma Rays, And Neutrinos, 7594 Instruments And Techniques

Scientific paper

We present for the first time the results of a method that combines 3D tomography and differential emission measure (DEM) analysis to determine the 3D local differential measure (LDEM), which is a measure of the amount of plasma as a function of electron temperature within each volume element of the computation grid. The volume elements are (3 deg X 3 deg X 0.02 Rs). The input data are a time series of EUV images taken in the 17.1, 19.5 and 28.4 nm bands. The method, developed theoretically in a previous paper [Frazin et al. 2005, ApJ v. 628, p. 1070], involves a combination of solar rotational tomography (SRT) and classical differential emission measure (DEM) analysis. SRT uses solar rotation to "undo" the line-of-sight integrals, while DEM analysis determines the temperature distribution (LDEM) in each voxel. Temporal variations of the solar corona limit the applicability of SRT to structures that remain relatively stable on the two-week time scale. We show results for certain structures that were judged to be stable by watching the EIT movies. We anticipate dramatic increases in the temperature resolution of this technique with the XRT instrument.

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