GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy

Details GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy

Jul 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000spie.4006..915s&link_type=abstract

Proc. SPIE Vol. 4006, p. 915-926, Interferometry in Optical Astronomy, Pierre J. Lena; Andreas Quirrenbach; Eds.

Astronomy and Astrophysics

Astronomy

1

Scientific paper

A test-bench simulating the GAIA metrology system has been developed by TNO-TPD. The lines-of-sight of the two telescopes in the GAIA instrument are separated by an angle (called `basic angle') of about 106 degrees. The basic angle stability should be within 10 microarcsecond rms over the satellite revolution period of 3 hours, or should be at least known with this accuracy. The basic angle is monitored by a high-precision interferometric laser metrology system.

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