Further proton damage effects in EEV CCDs

Details Further proton damage effects in EEV CCDs Further proton damage effects in EEV CCDs

Mar 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991esasp.313..307a&link_type=abstract

In ESA, ESA Electronic Components Conference p 307-318 (SEE N91-32291 24-33)

Astronomy and Astrophysics

Astrophysics

3

Astrophysics, Charge Coupled Devices, Proton Damage, Proton Irradiation, Radiation Tolerance, Spacecraft Electronic Equipment, X Ray Spectroscopy, Spaceborne Astronomy, X Ray Telescopes

Scientific paper

A large number of spaceborne observatories have been proposed for which the detecting systems rely on Charge Coupled Device (CCD) imagers for the sensing function. The orbits of these missions will have different radiation environments, but most will encounter highly ionizing protons which cause degradation of the charge tranfer performance, which is a critical parameter for X-ray spectroscopic applications. Measurements of the degradation as a function of incremental dose, temperature of irradiation and of proton energy are described for different device architectures, including structures designed to minimize the interaction between signal charge and trapping sites. Charge transfer degradation at doses of as little as 100 rads (6 MeV protons) is measured. The increase in dark current with proton dose is described. Implications for future astrophysics missions are discussed.

Affiliated with

Also associated with

No associations

Rating

Further proton damage effects in EEV CCDs does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Further proton damage effects in EEV CCDs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Further proton damage effects in EEV CCDs will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1604946