Functional tests with an integrated image memory /for the faint object camera in the space telescope/

Details Functional tests with an integrated image memory /for the faint object camera in the space telescope/ Functional tests with an integrated image memory /for the faint object camera in the space telescope/

May 1980

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1980dglr.meet.....g&link_type=abstract

Deutsche Gesellschaft für Luft- und Raumfahrt, Jahrestagung, 13th, Braunschweig, West Germany, May 28-30, 1980, 25 p. In Germa

Computer Science

Computer Storage Devices, Faint Object Camera, Hubble Space Telescope, Image Processing, Test Facilities, Architecture (Computers), Block Diagrams, Microcomputers, Semiconductor Devices

Scientific paper

The paper deals with a test facility specially developed for the
integrated image memory of the faint object camera, in which image
integration does not occur photochemically but rather electronically in
a modular CMOS memory. Test patterns differ in the chosen trade-off
between the test time and error control range.

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