Focussing in the hard x-ray band

Astronomy and Astrophysics – Astronomy

Scientific paper

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Focussing, Hard X-Rays, Multilayer

Scientific paper

Several novel techniques can raise the upper limit of grazing incidence focussing to 100 keV, making it possible to extend the domain of focussing to studies of non-thermal processes. With an angular resolution of an arcminute or better, focussing reduces background to low levels. Consequently, a focussing instrument can be significantly more sensitive than a scanning collimator or coded masked system of similar aperture. In addition, the small area of the image facilitates the use of high spectral resolution detectors. Promising techniques for focussing hard x-rays include: reflecting x-rays more than twice on their way to the focus; non-traditional optical configurations based upon micro-channel plate arrays and capillaries, and two types of two-element, multilayer coatings, one with a uniform period and the other with a depth varying period. Long focal length and modular multiple focus configurations will augment the effective area in all cases. Telescopes which focus to 100 keV are strong candidates for the next generation of large x-ray observatories beyond AXAF and XMM.

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