Failure analysis of PC MCT caused by current

Computer Science – Performance

Scientific paper

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Scientific paper

The influence of larger constant current burning was studied and analyses on the failed detectors were given. "1/f" noise is observed in the reign of g-r noise, and the exponential factor had a trend of increasing with burning time. Peak wavelength and cutoff wavelength of the detectors had no apparent change during electrical burning, but there were decreases on the short wavelength side in spectral response. After a long time burning, minority carrier lifetime of the detectors decreased as well as black-body signals. Analyses showed that defects increased at the surface of detectors after burning, which was responsible for decreasing the detector performance, even detector failure.

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