Fabrication and performance at 1.33 nm of a 0.24-micron period multilayer grating

Computer Science – Performance

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Diffraction Patterns, Fabrication, Holography, Mirrors, Photolithography, Plasma Etching, Molybdenum, Optical Materials, Optical Properties, Performance Tests, Silicon

Scientific paper

The fabrication of a multilayer linear grating, characterization in the soft X-ray region, and modeling of its performance are reported. Holographic lithography was used to produce a 0.24-micron spatial period grating on a triode sputtered Mo/C multilayer mirror. The pattern was transferred into the multilayer mirror by reactive ion etching in an SF6 plasma after an intermediate lift-off step. The position and relative efficiency of the different orders of a grating etched down to the silicon substrate were measured at the Cu L-alpha-beta line (1.33 nm). The results are compared to the values calculated within the framework of a scalar kinematic diffraction theory of relief gratings.

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