Evaluation of O.35μm MH1RT sea of gates series

Statistics – Applications

Scientific paper

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Scientific paper

An evaluation of the MH1RT Sea of Gates ASIC series from the manufacturer Atmel, allowing integration up to 1,6 M used gate for space applications is on going. This evaluation consists of electrical characterization, physical analysis, endurance tests (silicon and package) and radiation tests in order to assess the specific failure modes and the reliability of this series in the space. At that present time, due to delay in parts manufacturing, physical analysis and endurance tests have not started yet. Today, only radiations tests are finished and showed : - preservation of functionality and AC/DC parameters within specification limits, after more than 100krad (low dose rate), - latch-up immunity up to 100MeV/cm /mg, and Bit Error Rate close to the ones of the MMG2RTP (0,5 μm), The objective of all these tests is to demonstrate the MH1RT ability to be used in space applications.

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