Computer Science
Scientific paper
Dec 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994gecoa..58.5633c&link_type=abstract
Geochimica et Cosmochimica Acta, vol. 58, Issue 24, pp.5633-5638
Computer Science
4
Scientific paper
Synchrotron X-ray reflectivity and X-ray diffraction techniques were used to characterizean otavite (CdCO 3 ) overgrowth during its precipitation from an aqueous solution onto a calcite (10 4) cleavage surface. X-ray reflectivity was used to measure the otavite thickness and the roughness of the calcite/otavite and otavite/fluid interfaces. Specular and off-specular X-ray diffraction were used to measure the crystallographic orientation and long-range atomic order of the otavite overgrowth. The otavite grew coherently with a (10 4) growth plane oriented parallal the calcite (10 4) cleavage surface. The average growth rate of the otavite for the first 9 hours was 15 Å · h - . During the early growth stage ( 50 Å), the otavite (10 4) lattice spacing ( d -value) was compressed by as much 2.2% in the direction perpendicular to the calcite cleavage surface. As the otavite thickness increased, this d -value approached that of bulk otavite. At a thickness of 443 Å, the otavite was determined to be of single-crystal quality (0.4° mosaic) and epitaxial with calcite. This study demonstrates a new and accurate approach for measuring in situ precipitation rates and growth mechanisms in mineral-fluid systems.
Chiarello Ronald P.
Sturchi Neil C.
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