Enhancement of dielectronic recombination by plasma electric microfields

Details Enhancement of dielectronic recombination by plasma electric microfields Enhancement of dielectronic recombination by plasma electric microfields

Nov 1976

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1976phrvl..37.1390j&link_type=abstract

Physical Review Letters, vol. 37, Nov. 22, 1976, p. 1390-1393. Navy-supported research;

Statistics

Computation

100

Electron-Ion Recombination, Iron, Plasma-Particle Interactions, Recombination Coefficient, Stark Effect, Charged Particles, Electric Fields, Ionic Reactions, Metal Ions, Spectral Line Width

Scientific paper

A description is presented of an application of techniques from Stark-broadening theory considered by Griem (1974) to the computation of dielectronic recombination rated for multiply charged Fe ions under the influence of plasma electric microfields. Attention is given to a dielectronic recombination process for which the effects of surrounding charged particles have been found to be important at surprisingly low densities.

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